TSP #127 - Teardown, Repair and Experiments with an Agilent E4981A High-Speed Capacitance Meter
In this episode Shahriar investigates an Agilent E4981A high-speed capacitance meter which fails self-test during startup. The instrument reports a series of errors associated with the CPU board. The teardown reveals a multi-board construction where the main analog assembly employs an FPGA for control and interface to the main CPU board. The unit has a disconnected ribbon cable between the analog board and the main CPU assembly. After correcting the problem the instrument completes self-test without errors.
After the repair the unit is used to measure several known capacitors for functionality verification. Finally the instrument is used to measure a hand-made parallel plate capacitor. The capacitor can accept various types of dielectric material whose impact is studied.
In this episode Shahriar repairs an Agilent E5071C ENA Vector Network Analyzer generously loaned by AllTest. Please visit their website for all your measurement, calibration and service needs:
sales@alltest.net
https://alltestchambers.net
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The network analyzer is missing the main HDD which initially prevents it from being tested. An image from a donor E5701C instrument is used to boot the unit and gain access to the instrument firmware. The unit shows an inaccurate S11 with an open Port 1 while S22 shows a perfect reflection. This indicates a potential problem with the Port 1 T/R module.
Teardown of the module reveals catastrophic damage to the resistive front-end coupler which has been mostly likely caused by a large RF input power incident. After cleaning the PCB area, a replacement coupler is constructed. The repaired unit is checked for full self-test and used to measure a YIG tuneable filter.
You can may check the Andostar microscope lineup here: (Direct Link / Not-tracked)
https://www.aliexpress.com/store/900802?spm=a2g0o.detail.100005.2.4d4f407ekYxi5H
More information about Wheatstone Bridge:
https://www.mwrf.com/technologies/test-measurement/article/21849280/the-wheatstone-bridge-how-does-it-impact-vna-measurements
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In this episode Shahriar reviews the Analog Discovery Pro 3000 Series, particular the ADP3450 model. The instrument offers a combination of mixed signal oscilloscope and dual-channel arbitrary waveform generator. The WaveForms free software can be used to perform a wide range of measurements. You can find more information about this product at:
https://digilent.com/shop/analog-discovery-pro-3000-series-portable-high-resolution-mixed-signal-oscilloscopes/
The review is organized at follows:
00:00 - Introductions
00:35 - Instrument overview, functions, specifications and design
04:53 - Detailed teardown and architecture overview
11:17 - WaveForms software, oscilloscope capabilities, catching glitches, trigger functions
19:18 - Mixed-Signal measurements, logic analyzer, cross-domain triggering
22:19 - Serial decode, digital trigger, correlated measurements
24:03 - Waveform generation, synchronized signals, modulations, sweeps, FFT, 3D spectrogram
28:46 - Network analyzer functionality, measuring linearity and frequency response of DUT
33:42 - Impedance analyzer functionality, measuring complex impedance across frequency
36:29 - Additional capabilities, tracer, scripting, etc.
37:39 - Concluding remarks
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In this episode Shahriar returns to the microscope LED upgrade challenge. The highest light density LED is used as a point source to improve Kohler illumination. Both transmission & reflected light sources are upgraded while maintaining the control purely through the microscope controls. The LED used can be found here:
https://www.digikey.com/en/products/detail/new-energy/XHP70B-00-0000-0D0BP250E-SB01/7428211
Several images are also presented using bright field, dark field as well as polarization manipulation.
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In this episode Shahriar reviews the Rohde & Shwarz RTB2004 10-Bit oscilloscope. With its high-resolution touch-screen, intuitive and capable GUI as well as excellent analog/digital performance this scope competes very well against other 2000 series instruments from Tektronix and Keysight. This extensive review includes instrument teardown, overview and dedicated experiments as follows:
01:17 – Model comparison and R&S scope lineup.
02:20 – Front panel, rear panel and overview.
05:01 – Instrument teardown and analysis.
13:37 – Power on and basic functions including intensity grading, XY mode.
26:29 – Multi-tone behavior, FFT and ADC performance.
33:17 – Experiment with ambient light follower: Analog and RS232 digital serial capture, triggering and analysis.
48:03 – Experiment with external DAC: Analog and I2C data capture and search using remote web interface.
57:19 – Built-in arbitrary waveform generator behavior and performance.
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As our first episode (Part 2/2) Shahriar will review two products from Saleae: "Logic" and the brand new "Logic16″. The video review also features USBee SX which is a direct competitor to Logic. Logic ($149) and Logic16 ($299) can be purchased directly from Saleae's website or from one of their distributors. Make sure you watch the next episode where we take these units apart to see what makes them tick!
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In this episode Shahriar repairs a fault SRS FS735 dual distribution amplifier. These instruments provide two independent 7-channel 10MHz distribution modules with exceptional signal purity and isolation. The instrument does not properly powers on which points to a potential problem with the internal power supply.
The unit has two identical power supplies; one for each module. Both power supplies have a failed startup capacitor which can be easily replaced. After the repair, the power supplies are verified for functionality and power delivery. The schematic of the entire unit is described as well as a view of the module PCB. The performance of the unit across frequency, harmonic distortion as well as isolation behavior is also measured and verified.
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In this episode Shahriar demonstrates the fundamentals of Phase Noise. The theory behind phase noise is presented both from a time-domain and frequency domain points of view. Various mathematical equations which represent phase noise behavior is also presented.
Phase noise measurement challenges and techniques are covered. Capabilities and limitations of different instruments for phase noise characterization is explained. The experiments show AM/PM modulations both in time and frequency domain and their relationships to phase noise measurements. Using a spectrum analyzer the phase noise of several synthesizers are shown. However, it is clear that the phase noise of an ultra-clean 1-GHz reference signal cannot be measured using traditional methods.
The concept of cross-correlation is introduced as a means of measuring phase noise below the phase noise of the measurement instrument. The block diagram of the an Agilent Phase Noise Analyzer is presented followed by a short teardown. The measured phase nose of the ultra-clean 1-GHz source is shown using correlation techniques which matches the datasheet.
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In this episode Shahriar demonstrates a full analysis of a CDM324 24GHz Doppler radar module from IC Station. Opening the module reveals a series of microwave PCB components and several active devices. A complete analysis of the module is presented. The unit is then measured and the impact of antenna impedance and power supply voltage on the output frequency is measured. The phase noise of the output signal is also measured. Using a series of servo motors, the radiation pattern of the antenna array in both azimuth and elevation is also presented.
Using the radar module the speed of a computer fan is remotely measure using an oscilloscope and FFT function.
You can buy your own module from (http://www.icstation.com/).
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